Sensing dipole fields at atomic steps with combined scanning tunneling and force microscopy.

CO tip functionalization inverts atomic force microscopy contrast via short-range electrostatic forces.

We investigate insulating Cu2N islands grown on Cu(100) by means of combined scanning tunneling microscopy and atomic force microscopy with two vastly different tips: a bare metal tip and a CO-terminated tip. We use scanning tunneling microscopy data as proposed by Choi, Ruggiero, and Gupta to unambiguously identify atomic positions. Atomic force microscopy images taken with the two different t...

qPlus magnetic force microscopy in frequency-modulation mode with millihertz resolution

Magnetic force microscopy (MFM) allows one to image the domain structure of ferromagnetic samples by probing the dipole forces between a magnetic probe tip and a magnetic sample. The magnetic domain structure of the sample depends on the alignment of the individual atomic magnetic moments. It is desirable to be able to image both individual atoms and domain structures with a single probe. Howev...

Combined scanning force microscopy and scanning tunneling spectroscopy of an electronic nano-circuit at very low temperature

Comparison of force sensors for atomic force microscopy based on quartz tuning forks and length-extensional resonators

The force sensor is key to the performance of atomic force microscopy (AFM). Nowadays, most atomic force microscopes use micromachined force sensors made from silicon, but piezoelectric quartz sensors are being applied at an increasing rate, mainly in vacuum. These self-sensing force sensors allow a relatively easy upgrade of a scanning tunneling microscope to a combined scanning tunneling/atom...

Electron Transfer through Organic Monolayers Directly Bonded to Silicon Probed by Current Sensing Atomic Force Microscopy : Effect of Chain Length and Applied Force